Energy-Dispersive X-Ray Spectroscopy (EDX)
Energy-dispersive X-ray spectroscopy (EDX) is a critical elemental analysis technique widely used in fields such as materials science, electronic component analysis, geology, and biology. EDX identifies the elemental composition and distribution of samples by detecting characteristic X-rays emitted when the sample is excited by an electron beam or X-rays. EDX technology provides qualitative and quantitative elemental analysis, supporting quality control, failure analysis, and materials research.
Basic Principles and Importance of EDX
EDX is based on the emission of characteristic X-rays from samples under high-energy electron beam or X-ray excitation. Each element emits characteristic X-rays with specific energies. EDX detectors measure these energies and generate spectrum graphs. By analyzing peak positions and intensities in the spectrum, the elemental composition and content of the sample are determined.
EDX is crucial for quality control and failure analysis of electronic components and materials. In electronic manufacturing, EDX can detect the elemental composition in solder joints, identifying contaminants that may cause welding issues. In materials science research, EDX provides information on the elemental distribution of nanostructures, aiding researchers in developing new materials and improving existing material performance.
Process of EDX
Testing Preparation:
● Define analysis objectives and requirements, and select appropriate EDX settings and parameters.
● Prepare test samples, ensuring the sample surface is clean and smooth for optimal analysis.
Sample Mounting:
● Secure the sample on the specimen stage to ensure stability and correct positioning.
● Load the sample in a Scanning Electron Microscope (SEM) or Transmission Electron Microscope (TEM) to provide a high-energy electron beam.
Element Excitation:
● Use high-energy electron beams or X-rays to excite atoms in the sample, generating characteristic X-rays.
● Adjust the energy and spot diameter of the electron beam or X-rays to optimize element excitation and signal intensity.
Spectrum Acquisition and Analysis:
● Use the EDX detector to measure the characteristic X-ray energies emitted from the sample, generating spectrum graphs.
● Analyze the spectrum graphs using specialized software to identify and quantify the elemental composition and content of the sample.
Report Preparation and Results Interpretation:
● Thoroughly document analysis results, including spectrum graphs and elemental analysis data.
● Compile detailed EDX analysis reports for subsequent quality control and research references.
EDX Equipment
● EDX Detector: High-sensitivity X-ray detectors are used to measure characteristic X-ray energies emitted from the sample. Common detector types include Silicon Drift Detectors (SDD) and Lithium Drift Silicon Detectors (Si(Li)).
● Microscopy Imaging System: Scanning Electron Microscope (SEM) or Transmission Electron Microscope (TEM), is used to provide high-energy electron beams and sample imaging.
● Specialized Analysis Software: Used for processing and analyzing EDX spectrum data, generating elemental composition and distribution images.
In our laboratory, Energy-Dispersive X-ray spectroscopy (EDX) is a critical tool to ensure the quality and performance of electronic components and materials. Through the use of advanced EDX equipment and techniques, we provide precise and comprehensive elemental analysis to our customers. This not only helps identify and avoid potentially defective components but also enhances overall product reliability and market competitiveness. Our analysis services ensure customers can confidently select and use the highest quality materials and components, thereby achieving superior product performance and safety.