SEM & EDS Testing Services
Scanning Electron Microscopy (SEM) and energy-dispersive X-ray Spectroscopy (EDS) are two essential analytical techniques widely used in materials science, electronic component analysis, geology, and biology. Combining these techniques, SEM provides high-resolution images of samples, while EDS performs elemental analysis, offering chemical composition information of the samples. The combined SEM and EDS testing provides comprehensive and precise analytical tools for research and quality control.
Basic Principles and Importance of SEM and EDS Testing
SEM uses a high-energy electron beam to scan the sample surface, generating high-resolution three-dimensional images. The interaction of the electron beam with the sample produces secondary electrons and backscattered electrons, which are detected to obtain surface morphology and compositional information. EDS detects characteristic X-rays emitted by the sample under electron beam excitation, determining the sample's elemental composition and distribution.
The combined use of SEM and EDS is significant in quality control and failure analysis. SEM can identify the microstructure and surface defects of samples, while EDS provides detailed elemental analysis, helping to identify contaminants and inconsistencies in material composition. These techniques are widely applied in electronic manufacturing, materials science, nanotechnology, and geological research.
Process of SEM and EDS Testing
Test Preparation:
● Define testing objectives and requirements, and select appropriate SEM and EDS settings and parameters.
● Prepare test samples, ensuring the sample surface is clean and smooth for optimal imaging and analysis results.
Sample Loading:
● Secure the sample on the sample stage, ensuring its stability and correct positioning.
● Load the sample in a high vacuum environment to reduce interactions between the electron beam and air molecules.
Electron Beam Scanning:
● Adjust the accelerating voltage, probe current, and scanning speed of the electron beam to optimize image resolution and contrast.
● Scan the sample surface point by point with the electron beam, collecting secondary and backscattered electron signals to generate high-resolution SEM images.
Elemental Analysis:
● Use the EDS detector to measure the energy of characteristic X-rays emitted by the sample, generating a spectrum.
● Analyze the spectrum with specialized software to identify and quantify the elemental composition and content of the sample.
Report Preparation and Results Interpretation:
● Record the test results in detail, including SEM images and EDS spectral data.
● Prepare a comprehensive SEM and EDS analysis report for subsequent quality control and research references.
SEM and EDS Testing Equipment
● Electron Gun: Generates the high-energy electron beam, with common types including tungsten filament electron guns and field emission guns (FEG).
● Detectors: Secondary electron detectors for imaging, backscattered electron detectors for atomic number contrast, and EDS detectors for elemental analysis.
● Microscopy Imaging System: Includes hardware and software for controlling electron beam scanning, image acquisition, and data processing.
● Specialized Analysis Software: Used to process and analyze SEM images and EDS spectral data, generating elemental composition and distribution images.
In our laboratory, SEM and EDS testing services are crucial tools for ensuring the quality and performance of materials and electronic components. Using advanced SEM and EDS equipment and techniques, we provide precise and detailed microstructural and elemental analyses for our clients. This helps identify and avoid the use of potentially defective materials, enhancing overall product reliability and market competitiveness. Our testing services ensure that clients can confidently select and use the highest quality materials and components, achieving superior product performance and safety.