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October 2025 saw major strides in semiconductor and T&M innovation—from automated IC testing to 3 nm EDA—driving precision, automation, and integrated design validation globally.

October 2025 Industry Highlights in Smarter Testing and Integration

October 2025 marked steady progress across the semiconductor and test & measurement industries. Key updates included advances in automated IC testing, power-device validation, battery simulation, and GHz-class digitizers. The month also saw new modular lab platforms, portable oscilloscopes, and China’s first fully independent EDA with 3 nm test equipment. Large-scale investments in advanced packaging and testing reflected growing synergy between R&D and manufacturing—signaling a global shift toward higher precision, greater automation, and more integrated electronic design validation.


Date: October 2, 2025
Keywords: analog IC test, automated DFT, Tessent Analog Test
Impacted Products: Analog integrated circuits (mixed-signal ICs)
Summary: Siemens has launched Tessent AnalogTest software, reducing analog-IC test pattern generation from months to days and achieving up to 100× faster testing than conventional methods.
Source: All About Circuits – Siemens Unveils ‘Groundbreaking’ Software for Automated Analog IC Tests


Date: October 8, 2025
Keywords: severe environment testing, interconnect reliability, SET qualification
Impacted Products: Connector assemblies for automotive, industrial and aerospace environments
Summary: Samtec has introduced two new product lines qualified under its Severe Environment Testing (SET) program, enhancing test reliability and performance validation for interconnects used in automotive, industrial, and aerospace applications.
Source: EE Journal – Samtec Expands Severe Environment Testing Product Offering


Date: October 8, 2025
Keywords: power semiconductor test, automated test system, ETS-800 D20
Impacted Products: Power semiconductors (SiC, GaN, IGBT, MOSFET)
Summary: Teradyne has introduced the ETS-800 D20 automated test system for power semiconductors, offering high channel density and parallel testing to address AI and EV era chip diversification.
Source: Bisinfotech – Teradyne Launches ETS-800 D20 Automated Power Semiconductor Tester


Date: October 9, 2025
Keywords: battery simulator, BMS test, emulation, hardware-in-the-loop, modular PXI
Impacted Products: Battery management systems (BMS), battery stack emulators, energy storage testing platforms
Summary: Pickering Interfaces has launched a 5 Amp battery simulator module for BMS testing, enabling stacked-battery emulation, enhanced repeatability, and significant test-cycle reduction.
Source: EEJournal – New 5 Amp Battery Simulator Module from Pickering Simplifies and Accelerates BMS Test


Date: October 10, 2025
Keywords: VNX+, SOSA aligned platform, plug-in card test, board validation 
Impacted Products: VNX+ plug-in cards (PICs), small form factor embedded systems
Summary: Elma Electronic has introduced the first lab platform aligned with the SOSA standard for VNX+ plug-in cards, enabling rapid validation and testing of boards and modules to accelerate development.
Source: EEJournal – Elma Releases Industry’s First VNX+ Lab Platform Aligned to SOSA to Accelerate Plug-In Card Development


Date: October 14, 2025
Keywords: advanced packaging, chip testing hub, packaging & test facility
Impacted Products: Semiconductor packaging services, chip test services, semiconductor assembly & test (OSAT) offerings
Summary: Amkor Technology has announced a US $7 billion investment in Arizona for a large-scale advanced packaging and testing campus, aimed at strengthening packaging and test capabilities and reshoring the supply chain.
Source: SemiMedia – Amkor to invest US $7 billion in Arizona for advanced chip packaging and testing hub


Date: October 14, 2025
Keywords: multichannel GHz digitizer, automated test instrumentation, high-speed sampling
Impacted Products: 
Summary: Spectrum Instrumentation has introduced its flagship multi-channel GHz digitizers (DN6.33x series) offering up to 12 synchronized input channels and sampling rates up to 10 GS/s, designed for high-precision automated test and measurement applications.
Source: All About Circuits – Spectrum Instrumentation Unveils Flagship Multi-Channel GHz Digitizers


Date: October 15, 2025
Keywords: EDA tools, domestic semiconductor test equipment, 3 nm test, SiCarrier
Impacted Products: 3 nm test platforms, chip verification/test equipment
Summary: A subsidiary of SiCarrier has reportedly launched China’s first fully independent EDA tools with proprietary IP, along with test equipment for 3 nm node, enhancing domestic validation capabilities in semiconductor design and test.
Source: TrendForce – SiCarrier Subsidiaries Reportedly Launch China’s Fully Independent EDA, 3 nm Test Equipment


Date: October 20, 2025
Keywords: ultra-portable oscilloscope, high-resolution ADC, portable test instrumentation, MHO900 series
Impacted Products: Digital oscilloscopes, portable test & measurement equipment, system debug tools
Summary: RIGOL launches the MHO900 Series portable high-resolution oscilloscopes with 4 channels, 1 GHz bandwidth, and 4 GSa/s sampling, designed for versatile test applications.
Source: Electropages – Ultra-portable High-Resolution Oscilloscopes Launched


Date: October 23, 2025
Keywords: 5G wireless device testing, RED compliance, EMC safety testing, Anritsu
Impacted Products: 5G wireless devices, cellular modules, test & measurement equipment for wireless compliance
Summary: Anritsu offers enhanced testing solutions to ensure 5G wireless devices meet EU regulatory requirements (RED), including safety, EMC and radio-spectrum efficiency, thereby facilitating smoother market entry in Europe.
Source: Electropages – Ensuring Safety and Compliance of 5G Wireless Devices

 

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