June 2024 Electronic Testing News Updates
Welcome to the latest updates from Rapid Rabbit on electronic component testing. In this June 2024 overview, we highlight the newest innovations and breakthroughs that are setting new standards in testing methodologies and ensuring superior quality of electronic components in the industry.
1. Date: June 7, 2024
Keywords: Silicon Carbide, Scanning Acoustic Microscope, Crystal Growing
Impacted Products: Scanning Acoustic Microscopes
Summary: The silicon carbide crystal growing industry employs advanced metrology techniques, particularly scanning acoustic microscopes, to detect minute defects crucial for high-performance electronic devices, enhancing quality control and reliability in SiC-based electronics production.
Source: Power Electronics News - SiC Crystal Defect Detection
2. Date: June 11, 2024
Keywords: NI, Hybrid AI
Impacted Products: LabView AI Technology
Summary: As testing products become more complex, National Instruments is integrating AI and machine learning into testing instruments, particularly for edge-level data processing and decision-making. LabView AI technology is in beta testing with partners, promising to reduce testing time and enhance efficiency.
Source: Electronics Weekly - Integrating AI in Testing
3. Date: June 12, 2024
Keywords: Element14
Impacted Products: NI, Keysight, Tektronix, Rohde & Schwarz
Summary: Element14 has broadened its Test & Measurement portfolio globally, including an extended range of products from NI and Keysight Technologies. This expansion enhances global accessibility and rapid delivery of high-quality testing equipment.
Source: Bisinfotech - Element14 Global Expansion
4. Date: June 13, 2024
Keywords: Rohde & Schwarz, RT-ZISO, Isolated Probe
Impacted Products: RT-ZISO Isolated Probe System
Summary: R&S introduced the RT-ZISO, an isolated probe system designed for measuring fast-switching signals in high common-mode voltage environments. It offers high CMRR and can handle inputs and offsets up to ±3 kV, making it ideal for precise differential measurements.
Source: EDN - RT-ZISO Isolated Probe Launch
5. Date: June 13, 2024
Keywords: Rohde & Schwarz, RT-ZISO, Isolated Probing System
Impacted Products: RT-ZISO Isolated Probing System
Summary: Rohde & Schwarz announced the RT-ZISO isolated probing system, designed for precise measurements of electronic components under high common-mode voltage and fast switching conditions, featuring a fiber-powered isolation structure for enhanced safety and measurement accuracy.
Source: Power Electronics News - New Isolated Probing System
6. Date: June 18, 2024
Keywords: Tektronix, Silicon Carbide, Gallium Nitride
Impacted Products: MSO 5 Series Oscilloscope, Function Generator, Keithley Units
Summary: John Tucker of Tektronix demonstrated their advanced double pulse testing system, crucial for identifying RDS(on) in silicon carbide and gallium nitride devices, ensuring precise measurements and reliable performance validation.
Source: Power Electronics News - Advanced Double Pulse Testing System
7. Date: June 19, 2024
Keywords: Sensor Optimization, Test Equipment
Impacted Products: Various Sensor Technologies
Summary: The sensor market, especially for wearables and medical devices, is growing rapidly. Optimizing sensor capabilities significantly enhances their accuracy, sensitivity, and range, critical for reliability and seamless integration with other system components.
Source: Embedded - Advancements in Sensor Technology
8. Date: June 20, 2024
Keywords: Pico Technology, USB-powered Oscilloscope
Impacted Products: PicoScope 3000E Oscilloscope
Summary: Pico Technology introduced the PicoScope 3000E, the first 5 GS/s oscilloscope fully powered by USB, combining high bandwidth and sampling rate with the convenience of USB power, designed for portability and ease of use in various settings.
Source: All About Circuits - PicoScope 3000E Launch
9. Date: June 24, 2024
Keywords: pSemi, SP4T RF Switch, High Frequency Applications
Impacted Products: PE42548 SP4T RF Switch
Summary: pSemi introduced the PE42548, an SP4T RF switch suitable for up to 30 GHz, ideal for testing and measurement, 5G, and satellite communications.
Source: EDN - New SP4T RF Switch
10. Date: June 25, 2024
Keywords: Pickering Interfaces, EV BMS Test Rig, Automotive Electronics
Impacted Products: EV BMS Test Rig
Summary: At the 2024 India EV Show, Pickering Interfaces showcased its EV BMS test rig, emphasizing its advanced modular signal switching and sensor simulation solutions for automotive electronics testing, including HIL simulation for ECU/VCU and BMS testing, crucial for the growing electric vehicle market.
Source: BISInfotech - EV BMS Test Rig Showcase